• Open Access

Interacting random-field dipole defect model for heating in semiconductor-based qubit devices

Yujun Choi and Robert Joynt
Phys. Rev. Research 6, 013168 – Published 14 February 2024

Abstract

Semiconductor qubit devices suffer from the drift of important device parameters as they are operated. The most important example is a shift in qubit operating frequencies. This effect appears to be directly related to the heating of the system as gate operations are applied. We show that the main features of this phenomenon can be explained by the two-level systems that can also produce charge noise if these systems are considered to form an interacting random-field glass. The most striking feature of the theory is that the frequency shift can be nonmonotonic in temperature. The success of the theory and the questions it raises considerably narrow the possible models for the two-level systems.

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  • Received 4 August 2023
  • Revised 10 January 2024
  • Accepted 17 January 2024

DOI:https://doi.org/10.1103/PhysRevResearch.6.013168

Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI.

Published by the American Physical Society

Physics Subject Headings (PhySH)

Quantum Information, Science & TechnologyCondensed Matter, Materials & Applied Physics

Authors & Affiliations

Yujun Choi and Robert Joynt*

  • Department of Physics, University of Wisconsin–Madison, Madison, Wisconsin 53706, USA

  • *rjjoynt@wisc.edu

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Issue

Vol. 6, Iss. 1 — February - April 2024

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